Inspection and Screening Techniques
With 70 years of experience in chemical analysis and applied research, Centexbel has developed a state-of-the-art chemical laboratory. When selecting the most advanced instruments or developing new testing methods, we always consider the daily needs of our industrial partners. In our ISO 17025 accredited lab, Centexbel offers a wide range of standardized tests.
The chemical lab takes great pride in its expertise in inspection techniques, testing of protective clothing, thermal analysis, elemental determination, chromatographic separation techniques, and emission testing of interior materials.
A Picture Is Worth a Thousand Words
Clear images greatly enhance communication between clients and suppliers across continents—we can immediately see what it's about. Researchers also rely on these images to verify whether their ideas have been translated into real innovations.
SEM picture of a foam material
Microscopy
Optical Microscopy and Image Analysis
With the latest microscopes, 3D reconstructions can be created. Using the Nikon Eclipse LVPol "3D", Centexbel captures step-by-step images. These Z-stacks can be mathematically combined into a 3D image, viewable with 3D glasses.
Another new imaging technique is "stitching", where multiple frames are merged into a single overview image for analysis. Today, image analysis is a routine technique, for example, to measure the parameters of trilobal extruded fibers.
Opto-Digital Microscopy
Digitalization is leading to new instruments that are gradually replacing binocular microscopes. With the Olympus DSX 100, Centexbel produces extremely clear images with exceptional depth of field. Combined with stitching, this provides a panoramic view of macro-objects—an extended focal image. Thanks to free tilting, samples can be viewed from all angles.
SEM Electron Microscopy
To observe nanomaterials, we use a high-performance electron microscope to:
- Assess the success of electrospinning
- Examine the deposition of carbon nanotubes (CNTs)
- Observe how nanofibrils reinforce polymer structures
Electron microscopy is not limited to nanomaterials. It is also ideal for:
- Observing the split structure of microfibers in hook-and-loop fasteners
- Imaging coated fabrics with embedded glass beads
- Visualizing foam cell structures
Mapping Techniques Beyond SEM
Mapping can also be performed using other techniques:
- µXRay techniques visualize the distribution of elements
- IR microscopy provides mapping of chemical compound distributions
- Dynamic Headspace Analysis (DHS) detects volatile and semi-volatile compounds (VOC and SVOC) in consumer goods
- LC-MS and ICP-MS can also be used in screening mode
By combining techniques, we can detect the presence of REACH/SVHC substances or a wide range of flame retardants.
XRF mapping
The Bruker Tornado M4 micro-XRF system maps elements from F to U. It rapidly measures the different component of a product, providing a wealth of information.
- With a range of 5 X-ray beams ranging from a fine 20 µm spot to a broader 4.5 mm spot—the system allows to optimize between spatial resolution and sensitivity for each application.
- Micro-XRF rapidly measures the different components of a product, providing a wealth of information at low costs, allowing to limit expensive tests like ICP analysis to parts that tested positive.
- Mapping of the presence of the different elements can be done on both the surface and cross-section of a sample, revealing the presence and intensity of tested chemical elements throughout a complex material.
Example of Mapping technique
Mapping with the Bruker Tornado M4 micro-XRF system of the chemical composition responsible for the spot on the sample.
This analysis reveals the presence of Fe, Zn, and Ti
Example of a spectrum obtained via XRF analysis
FTIR and FTIR-microscopy
FTIR is a powerful technique for analyzing material composition, particularly effective at detecting organic components.
Over the past 30 years, Centexbel has developed its own FTIR library of products commonly used in the textile and polymer industries, supplementing commercial databases.
- Quick FTIR analysis can identify the main material of your product (e.g., polymer, rubber), while detailed spectral interpretation by specialists can provide extensive information, such as compound composition or the presence and absence of additives.
- FTIR can also be combined with chemical extraction techniques to detect minor constituents in your material.
- Additionally, Centexbel’s FTIR microscope offers a spatial resolution of 50 µm, enabling the analysis of small particles on your material’s surface.
Combining XRF and FTIR
When imaging is combined with XRF and FTIR, a wide range of defects can be assessed.
This approach allows
- determining the composition of surface blooming
- identifying the nature and makeup of contaminants or unwanted spots
- analyzing the composition of small metal particles
Together, these techniques can quickly help trace the root cause of quality issues and defects in your product.
Veerle Herrygers